Picture of AFM, Atomic force microscopy
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MultiMode Picoforce with Nanoscope III controller (Veeco; Digital Instruments, USA), equipped with J, X, and PF scanners. The optional temperature controller provides sample heating from ambient to 50°C in air and liquid environments

Tool name:
AFM, Atomic force microscopy
Area/room:
128, Surface and corrosion science
Category:
Analytical
Manufacturer:
Nanoscope 3a
Model:
picoforce

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